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 Yonghee Shin's Publications
Conferences
  Yonghee Shin and Laurie Williams,
“Is Complexity Really the Enemy of Software Security?”,
The 4th Workshop on Quality of Protection (QoP’08),
co-located with CCS-2008, Short paper, October. 2008 (To appear).
 
  Yonghee Shin and Laurie Williams,
An Empirical Model to Predict Security Vulnerabilities using Code Complexity Metrics,
The 2nd International Symposium on Empirical Software Engineering and Measurement (ESEM’08), Short paper, October. 2008 (To appear).
 
  Yonghee Shin,
Exploring Complexity Metrics as Indicators of Software Vulnerability,
The 3rd International Doctoral Symposium on Empirical Software Engineering (IDoESE’08), co-located with ESEM-2008, October. 2008 (To appear).
 
 

Ben Smith, Yonghee Shin, Laurie Williams,
Proposing SQL Statement Coverage Metrics”,

The Fourth International Workshop on Software Engineering for Secure Systems (SESS'08)

in conjunction with the 30th International Conference on Software Engineering (ICSE 2008), Leipzig, Germany, 17 May, 2008.

 

  Laurie Williams and Yonghee Shin,
"
Work in Progress: Exploring Security and Privacy Concepts through the Development and Testing of the iTrust Medical Records System",
In the Proceedings of 36th Annual Frontiers in Education Conference (FIE 2006), San Diego, CA, 28-31 October 2006, pp.30-31.
 
  Yonghee Shin,
"
Improving the Identification of Actual Input Manipulation Vulnerabilities",
14th ACM SIGSOFT Symposium on Foundations of Software Engineering
(FSE2006) Doctoral Symposium, Portland, OR.
6 November 2006.
 
  Yonghee Shin, Laurie Williams, and Tao Xie,
"
SQLUnitGen: SQL Injection Testing Using Static and Dynamic Analysis",  
17th IEEE International Symposium on Software Reliability Engineering (ISSRE 2006)
, Student Program, Raleigh, NC, 7-10 November 2006.
 
Technical Reports
. Yonghee Shin, Laurie Williams, and Tao Xie,
"
SQLUnitGen: Test Case Generation for SQL Injection Detection",
North Carolina State University Department of Computer Science Technical report TR-2006-21, August 06, 2006.